Home    Key and supplementary comparisons    Calibration and Measurement Capabilities - CMCs
Key and supplementary comparisons - Information
CCPR-K5.2019
Information
Pilot / Contact
Participants
Results
Print out
Related links
KCDB Statistics
KCDB FAQs
KCDB Reports
CIPM MRA
JCRB
Find my NMI
Metrologia
Contact us
BIPM.KCDB@bipm.org
CCPR-K5.2019
Information
Metrology area, branch   Photometry and Radiometry, Properties of materials
Description   Spectral diffuse reflectance
Time of measurement   2019 - 2020
Status   Protocol complete
Reference(s)   CCPR-K5.2019 Registration and progress form
CCPR-K5.2019 Technical Protocol
Measurand   Average spectral diffuse reflectance of white samples by using 0º:d, d:0º, or equivalent goniometrically measured 0º:d geometry.
Parameter(s)   A parallel beam with a spectral bandwidth of 5 nm centred on the wavelengths of 360 nm, 380 nm, 400 nm, 420 nm, 440 nm, 480 nm, 530 nm, 580 nm, 630 nm, 680 nm, 730 nm, 780 nm, and 830 nm is used.
Transfer device(s)   2 pieces of white matte ceramic tiles and 2 pieces of sintered polytetrafluoroethylene (PTFE) samples
Comparison type   Key comparison
Consultative Committee  CCPR (Consultative Committee for Photometry and Radiometry)
Conducted by   CCPR (Consultative Committee for Photometry and Radiometry)